## ion probe microanalysis (IPMA)

https://doi.org/10.1351/goldbook.I03238
Any technique in which the specimen is bombarded by a focused beam of (primary) ions (diameter less than $$10\ \unicode[Times]{x3BC}\text{m}$$) and the (secondary) ions ejected from the specimen are detected after passage through a @M03732@.
Sources:
PAC, 1979, 51, 2243. (General aspects of trace analytical methods—IV. Recommendations for nomenclature, standard procedures and reporting of experimental data for surface analysis techniques) on page 2246 [Terms] [Paper]
PAC, 1983, 55, 2023. (Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)) on page 2025 [Terms] [Paper]